賀!本系許博一等3位同學榮獲「TAU 2013 Variation Aware Timing Analysis Contest」第二名(指導教授：麥偉基教授)
The TAU workshop is a highly interactive and engaging annual gathering of experts in electronic design automation (EDA) of timing, physical, power, electrical, and functional analysis and validation of digital and analog circuits and systems. We invite you all to join us at TAU 2013 to discuss and debate novel ideas and to lead creation of the next generation of EDA tools and methods. Find out what’s hot today and where in EDA research would people like to place their money and resources.
TAU 2013 contest: Variation aware timing analysis 
TAU 2013 invites you to participate in a software tool development contest on variation aware parametric timing analysis. With the increasing number and significance of manufacturing and environmental sources of variability in the design and use of modern VLSI designs, timing analysis considering the uncertainty due to variability is essential. At the same time, the growing complexity of modern designs require fast timing analysis, thereby requiring tools to adopt accuracy and run-time tradeoffs. The goals of this contest are the following.
- Motivate university level students to learn about modern VLSI design timing analysis in the presence of variability and encourage research in this area
- Provide insight to some challenging aspects of a "fast" parametric (e.g. statistical) static timing analysis tool, and look for novel solutions, the results of which may be interesting to both industry and academia
- Encourage use of parallel techniques for timing analysis (especially multi-threaded techniques)
- Facilitate creation of a public university level variation aware timer (would serve as a framework for contests in future)
(資料來源：https://sites.google.com/site/taucontest2013/)
得獎資訊請參閱附件檔案
9_sinha.pdf
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