104/09/01(二) Transient device-performance fluctuation: efficient measurement and simulation for the lifetime prediction of VLSI
國立清華大學資訊工程學系
Department of Computer Science
National Tsing Hua University
專題演講
SEMINAR
主講人: Prof. Takashi Sato(佐藤高史)
SPEAKER (the Graduate School of Informatics, Kyoto University)
題 目:Transient device-performance fluctuation: efficient
TOPIC measurement and simulation for the lifetime prediction of VLSI
時 間: 104 年 09月01日 (二) 2:30PM-4:30PM
DATE
地 點: 台達館615室
PLACE
聯絡人:張世杰教授
瀏覽數:
