跳到主要內容區

104/09/01(二) Transient device-performance fluctuation: efficient measurement and simulation for the lifetime prediction of VLSI

國立清華大學資訊工程學系

Department of Computer Science

National Tsing Hua University

專題演講

SEMINAR

主講人: Prof. Takashi Sato(佐藤高史)

SPEAKER  (the Graduate School of Informatics, Kyoto University)

題 目:Transient device-performance fluctuation: efficient

TOPIC   measurement and simulation for the lifetime prediction of VLSI

時  間: 104 年 0901日 (二)  2:30PM-4:30PM

DATE

地 點: 台達館615室

PLACE

                           

                  聯絡人:張世杰教授

瀏覽數:
登入成功